High Resolution Beam Profiling Camera with GigE Interface

Ophir “SP920G” GigE Silicon CCD High Resolution Camera designed specifically for industrial laser beam profiling applications.

The camera accurately captures and analyzes wavelengths from 190 nm to 1100 nm. It features a compact design, wide dynamic range, unparalleled signal to noise ratio, and high-speed GigE (Gigabit Ethernet) interface. This interface allows the camera to be used over larger distances from the laser to the PC, enabling beam measurement that could – due to safety or spatial concerns – not be possible via USB interfaces. The speed and flexibility also simplify OEM applications in manufacturing and plant engineering. The camera delivers 1624 × 1224 pixel resolution with a 4.4 µm pixel pitch for measuring beam widths of 44 μm to 5.3 mm. It also includes a photodiode synch to capture scattered laser light at even the most challenging nanosecond pulse rates. The CCD camera is supported by “BeamGage”, the industry’s most advanced beam analysis software. For more information please see https://www.ophiropt.com/

The camera is ideal for measuring CW and pulsed laser profiles in such high-speed applications as laser cutting of medical devices or welding of dissimilar materials.

Ophir Spiricon Europe GmbH
Guerickeweg 7
64291 Darmstadt, Germany
Phone: +49 (0)6151 708-0
Fax: +49 (0)6151 708-599